Statistical analysis of technological processes based on noise-tolerant clustering in the wavelet transform space

  • Г. Ю. Щербакова
  • С. Г. Антощук
  • В. Н. Крылов

Abstract

A statistical analysis of technological processes using noise-resistant clustering in the wavelet transform space has been developed. This approach allows you to control the technological process of production of electronic equipment in the case of noisy small samples of control data.

Published
2019-03-31
Issue
No. 72(72) (2009): Electrical engineering and electrical equipment
Section
Automated Electromechanical Systems