Multichannel device for collecting strain gauge parameters based on semiconductor strain gauges

  • В. В. Жильцов
  • В. Л. Костенко

Abstract

A multi-channel monitoring device has been developed for measuring strain gauges. A feature of the device is a high sensitivity, small measurement error. It is shown the possibility of expanding the informative capacity of the device by connecting standardized sensors of various parameters, reducing energy consumption and cost while improving the basic performance characteristics.

Published
2019-03-31
Issue
No. 72(72) (2009): Electrical engineering and electrical equipment
Section
Automated Electromechanical Systems