Decomposition method for localization of faulty electronic subcircuits

Abstract

A method for the localization of faulty subschemes of electronic devices based on the principle of decomposition is proposed. It is shown that by a multi-level (hierarchical) virtual partitioning of the overall device scheme into separate functional fragments and testing them in a certain way organized, one can single out the faulty subsystem. The effectiveness of the method of localization in the diagnosis of electronic devices is investigated.